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Imaging Nanoscopic Elasticity of Thin Film Materials by Atomic Force Microscopy: Effects of Force Modulation Frequency and Amplitude

✍ Scribed by Jourdan, J. S.; Cruchon-Dupeyrat, S. J.; Huan, Y.; Kuo, P. K.; Liu, G. Y.

Book ID: 118060170
Publisher: American Chemical Society
Year: 1999
Tongue: English
Weight: 339 KB
Volume: 15
Category: Article
ISSN: 0743-7463
DOI: 10.1021/la9902183

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