Characterization of materials' nanomechanical properties by force modulation and phase imaging atomic force microscopy with soft cantilevers

✍ Scribed by V. Snitka; A. Ulcinas; V. Mizariene

• Book ID: 114340777
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 306 KB
• Volume: 48
• Category: Article
• ISSN: 1044-5803
• DOI: 10.1016/s1044-5803(02)00199-7