Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
✍ Scribed by Dinelli, F.; Assender, H. E.; Takeda, N.; Briggs, G. A. D.; Kolosov, O. V.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 304 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-related technique originally introduced to study the surface elastic properties of sti † materials. We report elastic images of heterogeneous nanostructures with a lateral resolution of the order of a few nanometres. One of the main intentions of this paper is not only to show the capability of UFM to allow one to image surface elastic properties of sti † materials but also to show that UFM can be applied to relatively soft materials with reproducible and interpretable results. The samples presented were chosen over a wide range of sti †ness values (with YoungÏs modulus E = 0.1-400 GPa) : very sti † silicon carbide Ðbres embedded in a mullite matrix, less sti † carbon Ðbres embedded in an epoxy matrix and relatively compliant rubber inclusions in a polymethylmethacrylate matrix. A discussion of the conditions required to obtain unambiguous data is also provided. Results obtained using the more traditional force modulation mode are also presented and compared with the UFM images of the same samples.