✦ LIBER ✦

Imaging by time-of-flight secondary ion mass spectrometry of plasma patterned metal and oxide thin films

✍ Scribed by G. Coullerez; J. Baborowski; C. Viornery; Y. Chevolot; N. Xanthopoulos; N. Ledermann; P. Muralt; N. Setter; H.J. Mathieu

No coin nor oath required. For personal study only.

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