𝔖 Bobbio Scriptorium

✦ LIBER ✦

II-8 Characterization of bulk transfer CCD's using measurements on MOS capacitors and field-effect transistors

✍ Scribed by Mohsen, A.M.; Morris, F.J.

Book ID: 114591744
Publisher: IEEE
Year: 1974
Tongue: English
Weight: 194 KB
Volume: 21
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1974.18017

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurements on depletion-mode field eff

Measurements on depletion-mode field effect transistors and buried channel MOS capacitors for the characterization of bulk transfer charge-coupled devices

✍ A.M. Mohsen; F.J. Morris 📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 979 KB

Measurements on depletion-mode field eff

Measurements on depletion-mode field effect transistors and buried channel MOS capacitors for the characterization of bulk transfer charge-coupled devices : A. M. Mohsen and F. J. Morris. Solid-St. Electron. 18, 407 (1975)

📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 127 KB