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[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Methodology of optimization for microchannel heat exchanger

✍ Scribed by HeeSung Park, ; JongIn Jo, ; JaeYoung Chang, ; SunSoo Kim,

Book ID: 127081004
Publisher: IEEE
Year: 2006
Weight: 415 KB
Category: Article
ISBN-13: 9781424401536
DOI: 10.1109/stherm.2006.1625208

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