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[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Measurement and simulation of stacked die thermal resistances

✍ Scribed by Joiner, B.; Montes de Oca, J.; Neelakantan, S.

Book ID: 126642469
Publisher: IEEE
Year: 2006
Weight: 276 KB
Category: Article
ISBN-13: 9781424401536
DOI: 10.1109/STHERM.2006.1625230

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