𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Reliability of stack packaging varying the die stacking architectures for flash memory applications

✍ Scribed by Hossain, M.M.; Yongje Lee, ; Akhter, R.; Agonafer, D.; Pekin, S.; Dishongh, T.

Book ID: 126687802
Publisher: IEEE
Year: 2006
Weight: 909 KB
Category: Article
ISBN-13: 9781424401536
DOI: 10.1109/STHERM.2006.1625232

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Twenty-Second Annual IEEE Semicond

[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Measurement and simulation of stacked die thermal resistances

✍ Joiner, B.; Montes de Oca, J.; Neelakantan, S. 📂 Article 📅 2006 🏛 IEEE ⚖ 276 KB

[IEEE Twenty-Second Annual IEEE Semicond

[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Thermal management of high power memory module

✍ Heejin Lee, ; Haehyung Lee, ; Joonghyun Baek, ; Taegyeong Chung, ; Seyong Oh, 📂 Article 📅 2006 🏛 IEEE ⚖ 448 KB

[IEEE Twenty-Second Annual IEEE Semicond

[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Thermal management of an led light engine for airborne applications

✍ Wilcoxon, R.; Cornelius, D. 📂 Article 📅 2006 🏛 IEEE ⚖ 914 KB

[IEEE Twenty-Second Annual IEEE Semicond

[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - ASTM D 5470 TIM material testing

✍ Hanson, K. 📂 Article 📅 2006 🏛 IEEE ⚖ 501 KB

[IEEE Twenty-Second Annual IEEE Semicond

[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Methodology of optimization for microchannel heat exchanger

✍ HeeSung Park, ; JongIn Jo, ; JaeYoung Chang, ; SunSoo Kim, 📂 Article 📅 2006 🏛 IEEE ⚖ 415 KB

[IEEE Twenty-Second Annual IEEE Semicond

[IEEE Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Dallas, TX USA (March 14-16, 2006)] Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium - Advanced DBC (direct bonded copper) substrates for high power and high voltage electronics

✍ Schulz-Harder, J. 📂 Article 📅 2006 🏛 IEEE ⚖ 317 KB