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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Investigation into the performance of turbulence models for fluid flow and heat transfer phenomena in electronic applications

✍ Scribed by Dhinsa, K.; Bailey, C.; Pericleous, K.

Book ID: 126667958
Publisher: IEEE
Year: 2004
Weight: 497 KB
Category: Article
ISBN-13: 9780780383630
DOI: 10.1109/STHERM.2004.1291335

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