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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Comparative analysis of heat sink pressure drop using different methodologies

✍ Scribed by Loh, C.K.; Chou, D.J.

Book ID: 126657858
Publisher: IEEE
Year: 2004
Weight: 533 KB
Category: Article
ISBN-13: 9780780383630
DOI: 10.1109/STHERM.2004.1291317

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