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[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Total dose effects on elementary transistors of a comparator in bipolar technology

✍ Scribed by Bosc, J.M.; Sarrabayrouse, G.; Guerre, F.X.

Book ID: 126746727
Publisher: IEEE
Year: 1996
Weight: 463 KB
Category: Article
ISBN-13: 9780780330931
DOI: 10.1109/RADECS.1995.509781

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