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[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Recent advances in understanding total-dose effects in bipolar transistors

✍ Scribed by Schrimpf, R.D.

Book ID: 121329969
Publisher: IEEE
Year: 1996
Weight: 973 KB
Category: Article
ISBN-13: 9780780330931
DOI: 10.1109/RADECS.1995.509744

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