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[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - A radiation tolerant 0.6 μm CMOS technology

✍ Scribed by Lasserre, V.; Corbiere, T.; Thomas, B.; Rodde, K.

Book ID: 126655312
Publisher: IEEE
Year: 1996
Weight: 468 KB
Category: Article
ISBN-13: 9780780330931
DOI: 10.1109/RADECS.1995.509764

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