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[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - SPICE data base for neutron (1 MeV) radiation hardening design: permanent damage effects simulation of bipolar transistors

✍ Scribed by Rinaudo, O.; Zimmer, T.; Limtouch, S.; Bourgoin, G.; Lalande, P.

Book ID: 111859016
Publisher: IEEE
Year: 1996
Weight: 319 KB
Volume: 0
Category: Article
ISBN-13: 9780780330931
DOI: 10.1109/radecs.1995.509771

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