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[IEEE RADECS 2001. 2001 6th European Conference on Radiation and its Effects on Components and Systems - Grenoble, France (10-14 Sept. 2001)] RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605) - Characterization of the parasitic bipolar amplification in SOI technologies submitted to transient irradiation

✍ Scribed by Ferlet-Cavrois, V.; Marcandella, C.; Giraud, G.; Gasiot, G.; Colladant, T.; Musseau, O.; Fenouillet, C.; du Port de Poncharra, J.

Book ID: 118027513
Publisher: IEEE
Year: 2002
Weight: 378 KB
Volume: 0
Category: Article
ISBN-13: 9780780373136
DOI: 10.1109/radecs.2001.1159283

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