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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Near optimal machine learning based random test generation

โœ Scribed by Shakeri, Niki; Nemati, Nastaran; Ahmadabadi, Majid Nili; Navabi, Zainalabedin


Book ID
126815951
Publisher
IEEE
Year
2010
Weight
489 KB
Category
Article
ISBN
1424495555

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