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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - A process variation detection method

✍ Scribed by Melikyan, Vazgen; Mirzoyan, Davit; Petrosyan, Gor

No coin nor oath required. For personal study only.

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