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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Exploring modeling and testing of NAND flash memories

✍ Scribed by Di Carlo, Stefano; Fabiano, Michele; Piazza, Roberto; Prinetto, Paolo

No coin nor oath required. For personal study only.

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