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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - A technique of optimal built-in self-test circuitries generation

✍ Scribed by Chebykina, Natalia V.; Mosin, Sergey G.

No coin nor oath required. For personal study only.

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