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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - PDFs testing of combinational circuits based on covering ROBDDs

โœ Scribed by Matrosova, A.; Nikolaeva, E.


Book ID
121675764
Publisher
IEEE
Year
2010
Weight
782 KB
Category
Article
ISBN
1424495555

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