𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - Recent results of feasibility study to use the high T/sub c/ oxide superconductors for microwave tube magnets

✍ Scribed by Shiffman, C.A.; Sridhar, S.; Thomas, G.E.

Book ID: 115496449
Publisher: IEEE
Year: 1988
Weight: 334 KB
Volume: 0
Category: Article
DOI: 10.1109/iedm.1988.32871

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Technical Digest., International E

[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - Dielectric based antifuse for logic and memory ICs

✍ Hamdy, E.; McCollum, J.; Chen, S.-O.; Chiang, S.; Eltoukhy, S.; Chang, J.; Speer 📂 Article 📅 1988 🏛 IEEE ⚖ 306 KB

[IEEE Technical Digest., International E

[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - A new high sensitivity photo-transistor for area image sensors

✍ Yamashita, H.; Matsunaga, Y.; Iesaka, M.; Manabe, S.; Harada, N. 📂 Article 📅 1988 🏛 IEEE ⚖ 206 KB

[IEEE Technical Digest., International E

[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - DC and RF performance of 0.1 mu m gate length Al/sub 0.48/In/sub 0.52/As-Ga/sub 0.38/In/sub 0.62/As pseudomorphic HEMTs

✍ Mishra, U.K.; Brown, A.S.; Rosenbaum, S.E. 📂 Article 📅 1988 🏛 IEEE ⚖ 262 KB

[IEEE International Electron Devices Mee

[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Characterization of arsenic dose loss at the Si/SiO/sub 2/ interface using high resolution X-ray photoelectron spectrometry

✍ Kasnavi, R.; Pianetta, P.; Yun Sun, ; Renee Mo, ; Griffin, P.B.; Plummer, J.D. 📂 Article 📅 1998 🏛 IEEE ⚖ 344 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Silicon on thin BOX: a new paradigm of the CMOSFET for low-power and high-performance application featuring wide-range back-bias control

✍ Tsuchiya, R.; Horiuchi, M.; Kimura, S.; Yamaoka, M.; Kawahara, T.; Maegawa, S.; 📂 Article 📅 2004 🏛 IEEE ⚖ 333 KB