✦ LIBER ✦

[IEEE Symposium on VLSI Technology - Kyoto, Japan (1997.06.12-1997.06.12)] Symposium on VLSI Technology - Modeling And Characterization Of Si/SiO/sub 2/ Interface Roughness

✍ Scribed by Heng-Chih Lin, ; Kan, ; Yamanaka, ; Helms,

No coin nor oath required. For personal study only.

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