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[IEEE Symposium on VLSI Technology - Kyoto, Japan (1997.06.12-1997.06.12)] Symposium on VLSI Technology - Charging And Intrinsic-leakage Current Peaks In Thin Silicon-dioxide Films

โœ Scribed by Yamada, ; Yugami, ; Ohkura,


Book ID
126648928
Publisher
IEEE
Year
1997
Weight
205 KB
Category
Article
ISBN-13
9784930813756

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