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[IEEE Symposium Non-Volatile Memory Technology 2005. - Dallas, TX, USA (7-10 Nov. 2005)] Symposium Non-Volatile Memory Technology 2005. - 3-dimensional analysis on the cell string current of NAND flash memory

✍ Scribed by Oh, H.-S.; Lee, S.-C.; Lee, C.-S.; Oh, D.-Y.; Kim, T.-K.; Song, J.-H.; Lee, K.-H.; Park, Y.-K.; Choi, J.-H.; Kong, J.-T.

Book ID: 121528483
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 252 KB
Category: Article
ISBN-13: 9780780394087
DOI: 10.1109/NVMT.2005.1541422

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