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[IEEE Semiconducting and Semi-Insulating Materials Conference - Toulouse, France (29 April-3 May 1996)] Proceedings of Semiconducting and Semi-Insulating Materials Conference - Transmission electron microscopy of Al-rich III-V oxides

✍ Scribed by Liliental-Weber, Z.; Li, M.; Li, G.S.; Chang-Hasnain, C.; Weber, E.R.

Book ID: 126641806
Publisher: IEEE
Year: 1996
Weight: 660 KB
Category: Article
ISBN-13: 9780780331792
DOI: 10.1109/SIM.1996.570930

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