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[IEEE Semiconducting and Semi-Insulating Materials Conference - Toulouse, France (29 April-3 May 1996)] Proceedings of Semiconducting and Semi-Insulating Materials Conference - Donor doping calibration in 4H-SiC using photoluminescence spectroscopy

✍ Scribed by Ivanov, I.G.; Hallin, C.; Henry, A.; Kordina, O.; Janzen, E.

Book ID: 126639170
Publisher: IEEE
Year: 1996
Weight: 271 KB
Category: Article
ISBN-13: 9780780331792
DOI: 10.1109/SIM.1996.570944

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