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[IEEE Second IEEE International Workshop on Electronic Design, Test and Applications - Perth, Australia (28-30 Jan. 2004)] Second IEEE International Workshop on Electronic Design, Test and Applications - High Quality TPG for Delay Faults in Look-Up Tables of FPGAs

✍ Scribed by Girard, P.; Heron, O.; Pravossoudovitch, S.; Renovell, M.

Book ID: 126649351
Publisher: IEEE
Year: 2004
Weight: 207 KB
Category: Article
ISBN-13: 9780769520810
DOI: 10.1109/DELTA.2004.10052

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