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[IEEE Second IEEE International Workshop on Electronic Design, Test and Applications - Perth, Australia (28-30 Jan. 2004)] Second IEEE International Workshop on Electronic Design, Test and Applications - Determining error rate in error tolerant VLSI chips

✍ Scribed by Breuer, M.A.

Book ID: 126664365
Publisher: IEEE
Year: 2004
Weight: 149 KB
Category: Article
ISBN-13: 9780769520810
DOI: 10.1109/DELTA.2004.10068

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