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[IEEE Second IEEE International Workshop on Electronic Design, Test and Applications - Perth, Australia (28-30 Jan. 2004)] Second IEEE International Workshop on Electronic Design, Test and Applications - On Using Test Vector Differences for Reducing Test Pin Numbers

✍ Scribed by Flottes, M.-L.; Poirier, R.; Rouzeyre, B.

Book ID: 121371714
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 155 KB
Category: Article
ISBN-13: 9780769520810
DOI: 10.1109/DELTA.2004.10018

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