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[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Radiation response of MOSFET's parameters as a function of measurement temperature

✍ Scribed by Belyakov, V.V.; Zebrev, G.I.; Shvetzov-Shilovsky, I.N.; Useinov, R.G.

Book ID: 115482134
Publisher: IEEE
Year: 1998
Weight: 479 KB
Volume: 0
Category: Article
ISBN-13: 9780780340718
DOI: 10.1109/radecs.1997.698878

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