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[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Spatial and spectral oxide trap distributions in power MOSFETs

โœ Scribed by Torres, A.; Flament, O.; Marcandella, C.; Musseau, O.; Leray, J.L.


Book ID
115469584
Publisher
IEEE
Year
2000
Weight
477 KB
Edition
1999
Volume
0
Category
Article
ISBN-13
9780780357266

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