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[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Total dose hardness of a commercial SiGe BiCMOS technology

✍ Scribed by van Vonno, N.; Lucas, R.; Thornberry, D.

Book ID: 120084664
Publisher: IEEE
Year: 2000
Weight: 354 KB
Edition: 1999
Category: Article
ISBN-13: 9780780357266
DOI: 10.1109/RADECS.1999.858617

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