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[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Correlation between transmission-line-pulsing I-V curve and human-body-model ESD level on low temperature poly-Si TFT devices

✍ Scribed by Ming-Dou Ker, ; Chun-Lin Hou, ; Chih-Yih Chang, ; Fang-Tsun Chu,

Book ID: 126599090
Publisher: IEEE
Year: 2004
Weight: 257 KB
Category: Article
ISBN-13: 9780780384545
DOI: 10.1109/IPFA.2004.1345598

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