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[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - A new method based on charge pumping technique to extract the lateral profiles of localized charge trapping in nitride

โœ Scribed by Huiqing Pang, ; Liyang Pan, ; Lei Sun, ; Ying Zeng, ; Zhaojian Zhang, ; Jun Zhu,


Book ID
118265267
Publisher
IEEE
Year
2005
Weight
253 KB
Volume
0
Category
Article
ISBN-13
9780780392038

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