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[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Precise analogue characterization of MIM capacitors using an improved charge-based capacitance measurement (CBCM) technique

✍ Scribed by Zhenqiu Ning, ; Delecourt, H.-X.; De Schepper, L.; Gillon, R.; Tack, M.

Book ID: 118167789
Publisher: IEEE
Year: 2005
Weight: 226 KB
Volume: 0
Category: Article
ISBN-13: 9780780392038
DOI: 10.1109/essder.2005.1546637

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