[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - Enhancement and degradation of drain current in pseudomorphic AlGaAs/InGaAs HEMTs induced by hot-electrons

[IEEE Proceedings of 1995 IEEE Internati

✍ Horio, K.; Usami, K.; Satoh, K. 📂 Article 📅 1995 🏛 IEEE ⚖ 434 KB

[IEEE Proceedings of 1995 IEEE Internati

✍ Duheon Song, ; Junhee Lim, ; Kyungho Lee, 📂 Article 📅 1995 🏛 IEEE ⚖ 452 KB

[IEEE Proceedings of 1995 IEEE Internati

✍ Yun, I.; Menkara, H.M.; Yang Wang, ; Oguzman, I.H.; Kolnik, J.; Brennan, K.F.; M 📂 Article 📅 1995 🏛 IEEE ⚖ 635 KB

[IEEE Proceedings of 1995 IEEE Internati

✍ Nozoe, M.; Ikota, M.; Motomura, N. 📂 Article 📅 1995 🏛 IEEE ⚖ 691 KB

[IEEE Proceedings of 1995 IEEE Internati

✍ Wei Zhang, ; Li, Z.G.; Cheng, Y.H.; Guo, W.L.; Wang, Z.; Sun, Y.H.; Li, X.X. 📂 Article 📅 1995 🏛 IEEE ⚖ 559 KB

[IEEE Proceedings of 1995 IEEE Internati

✍ Hochwitz, T.; Henning, A.K.; Daghlian, C.; Bolam, R.; Coutu, P.; Gluck, R.; Slin 📂 Article 📅 1995 🏛 IEEE ⚖ 851 KB