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[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - Reliability assessment of multiple quantum well avalanche photodiodes

✍ Scribed by Yun, I.; Menkara, H.M.; Yang Wang, ; Oguzman, I.H.; Kolnik, J.; Brennan, K.F.; May, G.S.; Summers, C.J.; Wagner, B.K.

Book ID: 126609665
Publisher: IEEE
Year: 1995
Weight: 635 KB
Category: Article
ISBN-13: 9780780320314
DOI: 10.1109/RELPHY.1995.513675

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