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[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - Boron compounds as a dominant source of alpha particles in semiconductor devices

✍ Scribed by Baumann, R.; Hossain, T.; Murata, S.; Kitagawa, H.

Book ID: 121243995
Publisher: IEEE
Year: 1995
Weight: 712 KB
Category: Article
ISBN-13: 9780780320314
DOI: 10.1109/RELPHY.1995.513695

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