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[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - A new analysis of stress relaxation phenomena for stress-migration tolerance estimation

✍ Scribed by Kawano, Y.; Ohta, T.

Book ID: 126626763
Publisher: IEEE
Year: 1995
Weight: 581 KB
Category: Article
ISBN-13: 9780780320314
DOI: 10.1109/RELPHY.1995.513702

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