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[IEEE Oper. Center 2003 International Semiconductor Conference. CAS 2003 - Sinaia, Romania (28 Sept.-2 Oct. 2003)] 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676) - MOSFET mobility degradation modelling

✍ Scribed by Babarada, F.; Profirescu, M.D.; Rusu, A.

Book ID: 126725625
Publisher: IEEE Oper. Center
Year: 2003
Weight: 242 KB
Category: Article
ISBN-13: 9780780378216
DOI: 10.1109/SMICND.2003.1252440

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