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[IEEE Oper. Center 2003 International Semiconductor Conference. CAS 2003 - Sinaia, Romania (28 Sept.-2 Oct. 2003)] 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676) - Transient analysis of Si-MOS and SiC-JFET cascode power switches

✍ Scribed by Boianceanu, C.; Brezeanu, M.; Palfi, A.; Mihaila, A.; Brezeanu, G.; Udrea, F.; Amaratunga, G.; Enache, I.

Book ID: 111650967
Publisher: IEEE Oper. Center
Year: 2003
Weight: 218 KB
Volume: 0
Category: Article
ISBN-13: 9780780378216
DOI: 10.1109/smicnd.2003.1252423

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