𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Seattle, WA (May 31-June 1, 1992)] NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - The Thermodynamic Model as Common Base for Modeling Integrated Microsensors and Smart Electronic Devices

✍ Scribed by Wachutka, G.

Book ID: 126629554
Publisher: IEEE
Year: 1992
Weight: 446 KB
Category: Article
ISBN-13: 9780780305168
DOI: 10.1109/NUPAD.1992.673849

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE NUPAD IV. Workshop on Numerical Mo

[IEEE NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Seattle, WA (May 31-June 1, 1992)] NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Modeling the Growth and Annealing of Dislocation Loops

✍ Borucki, L. 📂 Article 📅 1992 🏛 IEEE ⚖ 478 KB

[IEEE NUPAD IV. Workshop on Numerical Mo

[IEEE NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Seattle, WA (May 31-June 1, 1992)] NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Computing Folds and Bifurcations in current-Voltag Characteristics of Semiconductor Devices

✍ Coughran, W.M.; Grosse, E. 📂 Article 📅 1992 🏛 IEEE ⚖ 403 KB

[IEEE NUPAD IV. Workshop on Numerical Mo

[IEEE NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Seattle, WA (May 31-June 1, 1992)] NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Majority and Minority Mobilities in Heavily Doped Silicon for Device Simulations

✍ Bennett, H.S.; Lowney, J.R. 📂 Article 📅 1992 🏛 IEEE ⚖ 414 KB

[IEEE NUPAD IV. Workshop on Numerical Mo

[IEEE NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Seattle, WA (May 31-June 1, 1992)] NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - BTU - Berkeley Topography Utilities for Linking Topography and Impurity Profile Simulations

✍ Wang, R.H.; Gabara, A.; Neurether, A. 📂 Article 📅 1992 🏛 IEEE ⚖ 569 KB

[IEEE NUPAD IV. Workshop on Numerical Mo

[IEEE NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Seattle, WA (May 31-June 1, 1992)] NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Fractal Network Diffusicm of Fluorine and Boron in Polysilicon Gates

✍ Orlowski, M.; Hsing-Huang Tseng, ; Hance, R.; Tobin, P.J. 📂 Article 📅 1992 🏛 IEEE ⚖ 341 KB

[IEEE NUPAD IV. Workshop on Numerical Mo

[IEEE NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Seattle, WA (May 31-June 1, 1992)] NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, - Consistent User Interface and Task Level Architecture of a TCAD System

✍ Halama, S.; Fasching, F.; Pimingstorfer, H.; Tuppa, W.; Selberherr, S. 📂 Article 📅 1992 🏛 IEEE ⚖ 362 KB