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[IEEE Ninth IEEE/CHMT International Symposium on Electronic Manufacturing Technology,Competitive Manufacturing for the Next Decade - Washington, DC, USA (1-3 Oct. 1990)] Ninth IEEE/CHMT International Symposium on Electronic Manufacturing Technology,Competitive Manufacturing for the Next Decade - FAULTS: an equipment maintenance and repair system using a relational database

✍ Scribed by Mudei, D.C.; Chang, N.H.

Book ID: 125463615
Publisher: IEEE
Year: 1990
Weight: 551 KB
Category: Article
DOI: 10.1109/iemt9.1990.114977

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