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[IEEE Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Linz, Austria (2011.04.18-2011.04.20)] 2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - LED system reliability

โœ Scribed by van Driel, W.D.; Yuan, C.A.; Koh, S.; Zhang, G.Q.


Book ID
121309954
Publisher
IEEE
Year
2011
Weight
940 KB
Category
Article
ISBN
1457701073

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