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[IEEE Management Symposium (SEMI-THERM) - San Jose, CA, USA (2011.03.20-2011.03.24)] 2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Thermal management of MOSFET junction temperature in RF amplifier

✍ Scribed by Qi, Zhongwei; Dong, Huaiyu; Wang, Yahong; Reif, John W.

Book ID: 120064818
Publisher: IEEE
Year: 2011
Weight: 546 KB
Category: Article
ISBN: 1612847404
DOI: 10.1109/STHERM.2011.5767195

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