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[IEEE Management Symposium (SEMI-THERM) - San Jose, CA, USA (2011.03.20-2011.03.24)] 2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium - High performance air-cooled temperature margining thermal tools for silicon validation

✍ Scribed by Mohammed, Rahima; Sahan, Ridvan; Xia, Yi; Pang, Ying-feng

Book ID: 118011915
Publisher: IEEE
Year: 2011
Weight: 681 KB
Volume: 0
Category: Article
ISBN: 1612847404
DOI: 10.1109/stherm.2011.5767210

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