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[IEEE InterSociety Conference on Thermal Phenomena in the Fabrication and Operation of Electronic Components. I-THERM '88 - Los Angeles, CA, USA (11-13 May 1988)] InterSociety Conference on Thermal Phenomena in the Fabrication and Operation of Electronic Components. I-THERM '88 - Temperature measurement in Al films during electromigration test

✍ Scribed by Jin, H.; Gao, G.-B.

Book ID: 126713870
Publisher: IEEE
Year: 1988
Weight: 215 KB
Category: Article
DOI: 10.1109/ITHERM.1988.28672

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