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[IEEE InterSociety Conference on Thermal Phenomena in the Fabrication and Operation of Electronic Components. I-THERM '88 - Los Angeles, CA, USA (11-13 May 1988)] InterSociety Conference on Thermal Phenomena in the Fabrication and Operation of Electronic Components. I-THERM '88 - An inverse method to determine the temperature profile on a semiconductor power diode

✍ Scribed by Lestina, T.G.; Kaminski, D.A.; Rodriguez, E.

Book ID: 121731634
Publisher: IEEE
Year: 1988
Weight: 654 KB
Category: Article
DOI: 10.1109/ITHERM.1988.28669

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