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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - A high-resolution jitter measurement technique using ADC sampling

✍ Scribed by Cherubal, S.; Chatterjee, A.

Book ID: 121397979
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 776 KB
Category: Article
ISBN-13: 9780780371699
DOI: 10.1109/TEST.2001.966706

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