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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Ramp testing of ADC transition levels using finite resolution ramps

✍ Scribed by Max, S.

Book ID: 111886916
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 546 KB
Volume: 0
Category: Article
ISBN-13: 9780780371699
DOI: 10.1109/test.2001.966667

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